X-Rays Diffraction Analysis of Mg (2 mol%) Doped ZnO Thin Layers on Si Substrates

Author: Cho Cho Myat Aung1,Than Than Win2 , Ko Ko Kyaw Soe1

Abstract:

         Mg (2 mol%) doped ZnO thin layer are prepared by loquid phase deposition method and spin coating technique. Mg :  ZnO thin layer deposited on p-Si (100), heat treated at 400°C, 450°C, 500°C and 550°C for each 1 hr, respectively. XRD analysis are carried out to determine the crystallographic investigation of Mg : ZnO films. From the analysis, varstion of with lattice parameter is studied. 

Key words:  XRD, Lattice parameter

Published:  Published:  Myanmar Academy of Arts and Science Research Journal (Vol , No-2(A), March  2007, Physics)