Thursday, June 16, 2016

Preliminary Investigation of Zinc Telluride Film

Author: Than Than Win1, Yee Yee Oo1, and Yin Maung Maung2
Abstract:
Zinc telluride (Zn1-x Tex) powders have been subjected to various characterization studies like X-ray diffraction, Thermal Gravimetric Analysis and Differential Thermal Analysis (TGA-DAT) and Scanning Electron Microscopy (SEM). The XRD study confirmed the crystal structure of ZnTe and TGA-DTA studies showed the thermal properties.  The SEM was studied to measure the particle size of ZnTe powder. ZnTe film was grown on stainless steel substrates by electroplating method at different mass of solute content. Film thickness on the stainless steel substrates were obtained by viscometer.
Key words :    XRD, TGA-DTA, SEM

Published:  Myingyan Degree College Research Journal ( Vol-1 )
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1 comment:

  1. tiger shrofOctober 20, 2016 at 11:09 AM

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