Author: Moe Moe Aye1 , Than Than Win2, Than Htoon3, Yin Maung Maung 1 and Ko Ko Kyaw Soe4
Abstract:
ZnMnO3, film was grown on p-Si (100) substrate at different process temperatures. Structural properties of these films were checked by XRD technique. As the photovoltaic application, Voc-Isc variation curve was studied and some important parameters were observed.
Published: Published: Myanmar Academy of Arts and Science Research Journal (Vol.VI,No-2(B), March 2008, Physics)
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