Author: Kyaw Zaw1, Myint Myint Win2 , Cho Cho Myat Aung2, Myint Kalyar2, Moh Moh Lwin2,
Yin Maung Maung2, Than Than Win3 & Ko Ko Kyaw Soe4
Abstract:
The first of this cell was concerned with the growth of ZnO film on the naked p-Si(100)- substrate. XRD analysis was carried out to identify film structure, phase assignment and crystallographic properties while the micro-structural properties of ZnO film were obtained by SEM.
Key words : ZnO film, XRD, SEM
Published: Published: Myanmar Academy of Arts and Science Research Journal (Vol.VI,No-2(B), March 2008, Physics)
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